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News 258222

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  • 首頁
  • 關於長洛
    • 公司簡介
    • 治理原則
    • 公司優勢
  • 產品介紹
    • H-Square
      • Automated Wafer Handling
        • Wafer Transfers
          • AHWT
          • AVT
          • LCT2
          • LCT1AS12
          • WS200
          • WS300
        • Inspection Tools
          • BLIS
          • AET
          • WPR
        • Openers
          • AFO
          • FOMH
          • SMIFPO8
          • SMIFPO16
      • Manual Wafer Handling
        • Breezes
          • Vertical Handle Breeze 12″
          • H2BST-12
        • Mechanical Picks & Mask Picks
          • Mask Picks
          • Mechanical Wafer Picks
        • Vacuum Wand Sets
      • Bulk Aligners
        • Flat Aligners
          • FFTB1
          • FFTBAS-456
          • MFEZ
          • AFEZ
        • Notch Aligners
          • Manual Notch Aligner – NFEZ
          • Automatic Notch Aligner – ANFEZ
      • Cassettes
        • Stainless Steel & Aluminum Cassettes
          • MCF Series
          • MC12 Series
          • SSC Series
          • Open End Wall Cassette
        • Photomask Cleaning Cassettes
          • PC Series
    • Semiconductor
      • Scienscope Xspection 3000 2D/2.5D X RAY
      • Scienscope Xspection 1860 2D/2.5D X RAY
      • Cheetah EVO
      • FF35 CT
      • Thermal Air TA-5000
      • Thermal Wafer Chucks
      • Wafer ID Reader
      • Automatic Debonder Machine
      • Warpage Adjustment Tool
      • Batch Wafer ID Reader
      • WX3000
      • WaferSense
      • 晶圓紫外光 UV ERASE-光清洗燈管
      • 晶圓紫外光 UV ERASE機
      • In-Line Batch Plasma
      • SQ3000
      • ProbeSense™
      • SQ3000 M2
    • Advanced Semiconductor Test
      • Engineering Probe System
      • RF Probe & Accessories
      • Micro Positioner
    • Laser System
    • LED Assembly Process
      • Capillary
      • CSP P-S-T Solution
      • COB Solution
        • AP-100 Semi-Auto
        • CPA-100 Fully-Auto
        • CPS-A1300 Fully-Auto
      • Dispensing Product
      • Molding Equipment
    • LED Chip Process
      • Wafer/Chip Probe
        • 3GS
        • 4G
        • P7602P
        • P80C4
        • Probe Needles
      • Sorter
        • LEDA M76FP
      • AOI
        • LEDA A2000P
      • Tester
        • LEDA T200
    • 光學/數位顯微鏡
      • 超景深數位顯微鏡
      • Motic 全系列工業用顯微鏡
      • Objective Lens/ Digital image system /Component
    • Thermal Application
      • Thermal Air TA-5000
      • Thermal Wafer Chucks
      • ProbeSense™
    • 超微量點膠機
  • 人才招募
  • 聯絡我們
  • language
    • 繁體中文
    • English

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