CLIC
首頁
關於長洛
公司簡介
治理原則
公司優勢
產品介紹
H-Square
Automated Wafer Handling
Wafer Transfers
Bulk Automatic Horizontal Wafer Transfer – AHWT
Automatic Bulk Vertical Wafer Transfer Tool – AVT
Low Contact Wafer Transfer 76mm – 200mm LCT2
Bulk, Automatic Horizontal Wafer Transfer – LCT1AS12
Automatic Single Wafer Transfer and Wafer Sorter WS200
Automatic Wafer Mover/Sorter 300mm – WS300
Inspection Tools
Mask/Wafer Inspection Station – BLIS
Escalator + Aligner – AET
Individual Wafer Presenter – WPR
Openers
FOUP/FOSB Opener – AFO
Manual FOUP or FOSB Opener – FOMH
Automatic M200 Opener – SMIFPO8
Automatic RSP150 Opener – SMIFPO16
Manual Wafer Handling
Breezes
Vertical Handle Breeze 12″
Horizontal Handle Breeze 12″ – H2BST-12
Mechanical Picks & Mask Picks
Mask Picks
Mechanical Wafer Picks
Vacuum Wand Sets
Bulk Aligners
Flat Aligners
Manual Flat Aligner – FFTB1
Manual Flat Aligner – FFTBAS-456
Manual Flat Aligner – MFEZ
Automatic Flat Aligner – AFEZ
Notch Aligners
Manual Notch Aligner – NFEZ
Automatic Notch Aligner – ANFEZ
Cassettes
Stainless Steel & Aluminum Cassettes
Process Aluminum Casssttes – MCF Series
300mm Aluminum Cassette – MC12 Series
Stainless Steel Thermal Process Cassettes – SSC Series
Open End Wall Cassette
Fuji Bakelite Plastic Process Cassettes & Cases
Advanced WIP Storage Boxes – FB-C Series
200mm Thin Wafer Process Cassettes – FB Series
Photomask Cleaning Cassettes
Photomask Cleaning Cassettes – PC Series
Semiconductor
Capillary
Thermal Air TA-5000
Thermal Wafer Chucks
Wafer ID Reader
Automatic Debonder Machine
Warpage Adjustment Tool
Batch Wafer ID Reader
WX3000
WaferSense
晶圓紫外光 UV ERASE-光清洗燈管
晶圓紫外光 UV ERASE機
In-Line Batch Plasma
SQ3000
ProbeSense™
Advanced Semiconductor Test
Engineering Probe System
RF Probe & Accessories
Micro Positioner
Nordson TEST & INSPECTION
SONOSACE Acoustic Microscope
Gen 7
D9650
D9650Z
DAGE X-ray Inspection System
Quadra 3
Quadra 5
Quadra 7
DAGE Bondtester
4000 Plus
4800 INTEGRA
4800 WAFER HANDLER INTEGRATION
Laser System
LED Assembly Process
Capillary
CSP P-S-T Solution
COB Solution
AP-100 Semi-Auto
CPA-100 Fully-Auto
CPS-A1300 Fully-Auto
Dispensing Product
Molding Equipment
LED Chip Process
Wafer/Chip Probe
3GS
4G
P7602P
P80C4
Probe Needles
Sorter
LEDA M76FP
AOI
LEDA A2000P
Tester
LEDA T200
光學/數位顯微鏡
超景深數位顯微鏡
Motic 全系列工業用顯微鏡
Objective Lens/ Digital image system /Component
Thermal Application
Thermal Air TA-5000
Thermal Wafer Chucks
ProbeSense™
超微量點膠機
人才招募
聯絡我們
繁體中文
English
首頁
關於長洛
公司簡介
治理原則
公司優勢
產品介紹
H-Square
Automated Wafer Handling
Wafer Transfers
Bulk Automatic Horizontal Wafer Transfer – AHWT
Automatic Bulk Vertical Wafer Transfer Tool – AVT
Low Contact Wafer Transfer 76mm – 200mm LCT2
Bulk, Automatic Horizontal Wafer Transfer – LCT1AS12
Automatic Single Wafer Transfer and Wafer Sorter WS200
Automatic Wafer Mover/Sorter 300mm – WS300
Inspection Tools
Mask/Wafer Inspection Station – BLIS
Escalator + Aligner – AET
Individual Wafer Presenter – WPR
Openers
FOUP/FOSB Opener – AFO
Manual FOUP or FOSB Opener – FOMH
Automatic M200 Opener – SMIFPO8
Automatic RSP150 Opener – SMIFPO16
Manual Wafer Handling
Breezes
Vertical Handle Breeze 12″
Horizontal Handle Breeze 12″ – H2BST-12
Mechanical Picks & Mask Picks
Mask Picks
Mechanical Wafer Picks
Vacuum Wand Sets
Bulk Aligners
Flat Aligners
Manual Flat Aligner – FFTB1
Manual Flat Aligner – FFTBAS-456
Manual Flat Aligner – MFEZ
Automatic Flat Aligner – AFEZ
Notch Aligners
Manual Notch Aligner – NFEZ
Automatic Notch Aligner – ANFEZ
Cassettes
Stainless Steel & Aluminum Cassettes
Process Aluminum Casssttes – MCF Series
300mm Aluminum Cassette – MC12 Series
Stainless Steel Thermal Process Cassettes – SSC Series
Open End Wall Cassette
Fuji Bakelite Plastic Process Cassettes & Cases
Advanced WIP Storage Boxes – FB-C Series
200mm Thin Wafer Process Cassettes – FB Series
Photomask Cleaning Cassettes
Photomask Cleaning Cassettes – PC Series
Semiconductor
Capillary
Thermal Air TA-5000
Thermal Wafer Chucks
Wafer ID Reader
Automatic Debonder Machine
Warpage Adjustment Tool
Batch Wafer ID Reader
WX3000
WaferSense
晶圓紫外光 UV ERASE-光清洗燈管
晶圓紫外光 UV ERASE機
In-Line Batch Plasma
SQ3000
ProbeSense™
Advanced Semiconductor Test
Engineering Probe System
RF Probe & Accessories
Micro Positioner
Nordson TEST & INSPECTION
SONOSACE Acoustic Microscope
Gen 7
D9650
D9650Z
DAGE X-ray Inspection System
Quadra 3
Quadra 5
Quadra 7
DAGE Bondtester
4000 Plus
4800 INTEGRA
4800 WAFER HANDLER INTEGRATION
Laser System
LED Assembly Process
Capillary
CSP P-S-T Solution
COB Solution
AP-100 Semi-Auto
CPA-100 Fully-Auto
CPS-A1300 Fully-Auto
Dispensing Product
Molding Equipment
LED Chip Process
Wafer/Chip Probe
3GS
4G
P7602P
P80C4
Probe Needles
Sorter
LEDA M76FP
AOI
LEDA A2000P
Tester
LEDA T200
光學/數位顯微鏡
超景深數位顯微鏡
Motic 全系列工業用顯微鏡
Objective Lens/ Digital image system /Component
Thermal Application
Thermal Air TA-5000
Thermal Wafer Chucks
ProbeSense™
超微量點膠機
人才招募
聯絡我們
繁體中文
English
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超景深數位顯微鏡
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Wafer Reader
Slide 1
RF Probe
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Analytical prober
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Celadon Systems
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Optical/Digital MicroScope
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Wafer ID Reader
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Thermal Wafer Chuck System
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Laser cutter/repair system
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Wire Bonding Capillary
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Slide 2
Thermal Test
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Wafer prober
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Wafer AOI/AVI system
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PCB TDR Test
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超微量點膠機
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UV Erase Lamp & Machine
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In-Line Batch Plasma
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PCB Loss Test
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