CLIC
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關於長洛
公司簡介
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H-Square
Automated Wafer Handling
Wafer Transfers
AHWT
AVT
LCT2
LCT1AS12
WS200
WS300
Inspection Tools
BLIS
AET
WPR
Openers
AFO
FOMH
SMIFPO8
SMIFPO16
Manual Wafer Handling
Breezes
Vertical Handle Breeze 12″
H2BST-12
Mechanical Picks & Mask Picks
Mask Picks
Mechanical Wafer Picks
Vacuum Wand Sets
Bulk Aligners
Flat Aligners
FFTB1
FFTBAS-456
MFEZ
AFEZ
Notch Aligners
Manual Notch Aligner – NFEZ
Automatic Notch Aligner – ANFEZ
Cassettes
Stainless Steel & Aluminum Cassettes
MCF Series
MC12 Series
SSC Series
Open End Wall Cassette
Photomask Cleaning Cassettes
PC Series
Semiconductor
Capillary
Thermal Air TA-5000
Thermal Wafer Chucks
Wafer ID Reader
Automatic Debonder Machine
Warpage Adjustment Tool
Batch Wafer ID Reader
WX3000
WaferSense
晶圓紫外光 UV ERASE-光清洗燈管
晶圓紫外光 UV ERASE機
In-Line Batch Plasma
SQ3000
ProbeSense™
SQ3000 M2
Advanced Semiconductor Test
Engineering Probe System
RF Probe & Accessories
Micro Positioner
Nordson TEST & INSPECTION
SONOSACE Acoustic Microscope
Gen 7
D9650
D9650Z
DAGE X-ray Inspection System
Quadra 3
Quadra 5
Quadra 7
DAGE Bondtester
4000 Plus
4800 INTEGRA
4800 WAFER HANDLER INTEGRATION
SQ3000 M2
Laser System
LED Assembly Process
Capillary
CSP P-S-T Solution
COB Solution
AP-100 Semi-Auto
CPA-100 Fully-Auto
CPS-A1300 Fully-Auto
Dispensing Product
Molding Equipment
LED Chip Process
Wafer/Chip Probe
3GS
4G
P7602P
P80C4
Probe Needles
Sorter
LEDA M76FP
AOI
LEDA A2000P
Tester
LEDA T200
光學/數位顯微鏡
超景深數位顯微鏡
Motic 全系列工業用顯微鏡
Objective Lens/ Digital image system /Component
Thermal Application
Thermal Air TA-5000
Thermal Wafer Chucks
ProbeSense™
超微量點膠機
人才招募
聯絡我們
繁體中文
English
首頁
關於長洛
公司簡介
治理原則
公司優勢
產品介紹
H-Square
Automated Wafer Handling
Wafer Transfers
AHWT
AVT
LCT2
LCT1AS12
WS200
WS300
Inspection Tools
BLIS
AET
WPR
Openers
AFO
FOMH
SMIFPO8
SMIFPO16
Manual Wafer Handling
Breezes
Vertical Handle Breeze 12″
H2BST-12
Mechanical Picks & Mask Picks
Mask Picks
Mechanical Wafer Picks
Vacuum Wand Sets
Bulk Aligners
Flat Aligners
FFTB1
FFTBAS-456
MFEZ
AFEZ
Notch Aligners
Manual Notch Aligner – NFEZ
Automatic Notch Aligner – ANFEZ
Cassettes
Stainless Steel & Aluminum Cassettes
MCF Series
MC12 Series
SSC Series
Open End Wall Cassette
Photomask Cleaning Cassettes
PC Series
Semiconductor
Capillary
Thermal Air TA-5000
Thermal Wafer Chucks
Wafer ID Reader
Automatic Debonder Machine
Warpage Adjustment Tool
Batch Wafer ID Reader
WX3000
WaferSense
晶圓紫外光 UV ERASE-光清洗燈管
晶圓紫外光 UV ERASE機
In-Line Batch Plasma
SQ3000
ProbeSense™
SQ3000 M2
Advanced Semiconductor Test
Engineering Probe System
RF Probe & Accessories
Micro Positioner
Nordson TEST & INSPECTION
SONOSACE Acoustic Microscope
Gen 7
D9650
D9650Z
DAGE X-ray Inspection System
Quadra 3
Quadra 5
Quadra 7
DAGE Bondtester
4000 Plus
4800 INTEGRA
4800 WAFER HANDLER INTEGRATION
SQ3000 M2
Laser System
LED Assembly Process
Capillary
CSP P-S-T Solution
COB Solution
AP-100 Semi-Auto
CPA-100 Fully-Auto
CPS-A1300 Fully-Auto
Dispensing Product
Molding Equipment
LED Chip Process
Wafer/Chip Probe
3GS
4G
P7602P
P80C4
Probe Needles
Sorter
LEDA M76FP
AOI
LEDA A2000P
Tester
LEDA T200
光學/數位顯微鏡
超景深數位顯微鏡
Motic 全系列工業用顯微鏡
Objective Lens/ Digital image system /Component
Thermal Application
Thermal Air TA-5000
Thermal Wafer Chucks
ProbeSense™
超微量點膠機
人才招募
聯絡我們
繁體中文
English
WaferSense
聯絡我們
